Follow-up labs associated with the NE 226 (Characterization of Materials) course. Lab topics may include: Reflective, transmissive, and polarized light optical microscopy; surface topography, and image analysis by scanning electron microscopy; film thickness determination by ellipsometry; crystal lattice measurements by x-ray diffractometry, infrared and Raman spectroscopy. [Offered: S] Prereq: NE 226; 3A Nanotechnology Engineering students only
